ELECTRON BACKSCATTER DIFFRACTION (EBSD)

The MES Surface Characterization lab provides Electron Backscatter Diffraction (EBSD) to characterize crystallographic properties of metal samples and thin films.  Proprieties that can be determined by this technique include: grain size, grain shape, grain orientation, grain boundary orientation, spatial distribution of phases, local deformation, and texture.

EBSD can be combined with Scanning Electron Microscopy, WDS, EDS or X-ray diffraction (XRD) services to provide a complete picture of your materials.

MES provides rapid inspection results at an affordable price. As an A2LA ISO 17025 accredited service provider, quality is our focus.

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CAPABILITIES

  • Texture Analysis in exact locations

  • Visualization of microstructure with spatial coordinates

  • Grain Size and Orientation Analysis

  • Phase Identification

  • Grain Boundary Analysis

SAMPLE REQUIREMENTS

  • Solid materials

  • Highly polished flat surface

SPECIFICATIONS

  • ASTM E2627

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